Abstract: Confocal microscopy is an essential component of wafer defect detection systems. Wafers are raw materials used in the manufacture of semiconductor chips. The semiconductor chip manufacturing ...
Abstract: Photometric stereo recovers the surface normals of an object from multiple images with varying shading cues, i.e., modeling the relationship between surface orientation and intensity at each ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results