The AI revolution is significantly outpacing the IC industry’s ability to sufficiently test multi-chip systems for all necessary failure mechanisms at probe, final test, and system-level test. The ...

Abstract: Robotic systems are becoming pervasive and adopted in increasingly many domains, such as manufacturing, healthcare, and space exploration. To this end, engineering software has emerged as a ...

Abstract: Static test compaction aims to reduce the number of generated test patterns after automatic test pattern generation (ATPG) to enable one pattern to detect more faults. However, existing ...