The AI revolution is significantly outpacing the IC industry’s ability to sufficiently test multi-chip systems for all necessary failure mechanisms at probe, final test, and system-level test. The ...
Abstract: Combinatorial problems are a common challenge in business, requiring finding optimal solutions under specified constraints. While significant progress has been made with variational ...
Abstract: This work presents a supervised machine-learning (ML) approach for blind digital calibration of SAR ADCs without requiring prior knowledge of errors. A 2-layer neural network learns the ...
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