NAGOYA, Japan--(BUSINESS WIRE)--It was announced today that GaN (Gallium Nitride)-based e-Beam inspection and metrology for advanced semiconductor manufacturing, jointly developed by Nagoya University ...
Hexagon Manufacturing Intelligence’s Stationary Metrology Division has released VGSTUDIO MAX 2026.2, introducing a new ...
PI solves focusing challenge with fast mechanisms and advanced controllers. PI’s nanofocusing stage options–voice coil (left) for longer travel, piezo (right) for minimum size and fastest response.
Fast piezo and voice-coil nano-focusing systems keep microscopes and metrology tools sharply focused with nanometer precision and millisecond response. (Nanowerk News) Whether inspecting semiconductor ...
SAN FRANCISCO, June 17, 2026 (GLOBE NEWSWIRE) -- Lumafield, a leading manufacturing intelligence platform, today announced Neptune Performance and Triton Performance, a new tier of high-performance ...
Abstract: Virtual metrology (VM) is a key enabler for advanced semiconductor manufacturing, providing rapid estimation of quality metrics from process data to improve sampling efficiency, shorten ...
Abstract: Concurrent design for modern flexible manufacturing systems demands multifaceted expertise, with early-stage consideration of metrology capabilities emerging as a critical area of research ...
Threat actors have been using short-form videos on TikTok and Instagram Reels to push the Vidar infostealer, disguising the attacks as tutorials for unlocking premium software for free. New analysis ...
Talleres Artificio, a mechanical engineering company based in Nogales, Chile, has integrated SHINING 3D‘s FreeScan Trak Nova into its inspection workflow for ball mill maintenance projects, cutting on ...
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