Jeff Johnson, mechatronics product manager, Beckhoff Automation Quality assurance bottlenecks are especially apparent when working with different components and in high-mix low-volume production. This ...

Stacking chips is making it far more difficult to find existing and latent defects, and to check for things like die shift, leftover particles from other processes, co-planarity of bumps, and adhesion ...

The semiconductor industry is defined by its relentless pursuit of smaller, faster, and more powerful chips. As we push into advanced 3D architectures like gate-all-around (GAA) transistors, a ...

Line-scan vs. area-scan cameras. Key ingredients to the high-speed machine-vision system for inspection. How to synchronize the wafers with the camera. Optical semiconductor inspection presents ...