Scan testing has been the foundation of digital-device production test for many years. Several innovations have been developed to keep up with the growth in pattern-set sizes brought about by large ...

For over 15 years, I've been a big proponent of hierarchical test. Hierarchical test is the commonly used term for creating DFT (design-for-test) features and test patterns at lower level circuit ...

Testing digital designs usually requires one or more digital signals, some of which can be very difficult to generate. Pattern generators are specifically designed to address this problem. Whatever ...

It’s no secret that a successful yield ramp directly impacts integrated circuit (IC) product cost and time-to-market. Tools and techniques that help companies ramp to volume faster, while also ...