The industry’s insatiable need for power in high-performance computing (HPC) is creating problems for test cells, which need to deliver very high currents at very consistent voltage levels through the ...

For anyone designing DC-DC converters, AC-DC power supplies, or the system around it, understanding the power supply’s operation under both the best and worst conditions is important. The load of the ...

A new high-voltage, wide-bandwidth probe gives engineers the ability to more accurately test the high-speed switching signals generated by the power electronics in electric vehicles (EVs) and ...

Wafer inspection has become a critical part of the semiconductor manufacturing process. Inspections performed after wafer test can analyze the marks left by probe cards to ensure that the test process ...