The size of designs continues to grow and IC manufacturers are pushing for higher test quality, especially in mission-critical applications such as transportation and medicine. More advanced nodes ...

Until the mid-1970s, compression testing of composite materials received relatively little attention. Up to that point it, had generally been assumed that the compressive stiffness was approximately ...

For the past five years, the cost of test has prevailed as the hottest topic in test. During this period, automated test equipment (ATE) has made a dramatic move towards low-cost design for test (DFT) ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Until the early 1970s, there was relatively little interest in measuring the compressive properties of composite materials. For design purposes, it was generally assumed that the compressive strength ...